Dynamic XPS reveals the thermal stability of HfSe2 bulk crystal

XPS measurements reveal a Fermi level variation on three different locations in the same geological MoS2 crystal

The graphene growth on Ni(111) surface by Low Energy Electron Microscopy (LEEM)

Single domain boundary is imaged with 14° tilt angle between domains in Terephthalic acid (TPA). This domain boundary may still be categorized as a small angle grain boundary as it is constructed by a line of dislocation cores

An STM image shows the formation of a dislocation during the growth of Bi2Se3 by Molecular beam epitaxy (MBE)

First HR STM image recorded on Al13Co4 surface

XPD pattern recorded on Al13Co4(100) surface