XPS survey spectrum measured on a freshly exfoliated surface of WSe2 crystal sample.
Formation of MoSe(2-x)Ox nanorods by etching MoSe2 and annealing in O2
STM image shows the transformation of CVD WSe2 monolayer to WOx using UV-Ozone
High-Resolution XPS (a) W 4f and (b) Se 3d core-level spectra recorded on pristine CVD WSe2 (lower spectra) and after O2 plasma treatment (upper spectra).
Atomically resolved STM image of CVD MoS2 monolayer transferred onto a Au film
Surface Reactivity of MoS2 Studied by Ambient Pressure X-ray Photoelectron Spectroscopy
Dynamic XPS reveals the thermal stability of HfSe2 bulk crystal
|XPS measurements reveal a Fermi level variation on three different locations in the same geological MoS2 crystal|
The graphene growth on Ni(111) surface by Low Energy Electron Microscopy (LEEM)
|Single domain boundary is imaged with 14° tilt angle between domains in Terephthalic acid (TPA). This domain boundary may still be categorized as a small angle grain boundary as it is constructed by a line of dislocation cores|
|An STM image shows the formation of dislocation during the growth of Bi2Se3 by Molecular beam epitaxy (MBE)|
First HR STM image recorded on Al13Co4 surface