I spent two years managing the ambient pressure surface characterization Lab (APSCL), December 2018 - February 2021

The Ambient Pressure Surface Characterization Laboratory (APSCL) has unique capabilities for preparation and characterization of samples in a range of environments. The capabilities are housed in Johnson Hall and includes microscopy, spectroscopy, and diffraction. Users can be trained to use the equipment for independent research projects or staff members can assist or perform the analysis for you. The APSCL has two main instruments which can be used for a range of surface characterization measurements. The primary capabilities are X-ray photoelectron spectroscopy (XPS) and scanning tunneling microscopy (STM).

AP-XPS Capabilities:
• Analysis pressures from near ambient pressure (25 mbar) to ultrahigh vacuum (UHV).
• Monochromatic Al Ka (hv = 1486.6 eV) for using in UHV and ambient pressure cell.
• Non-monochromatic Zr Mg (hv = 151.4 eV) | Ag La (hv = 2984.3 eV) for UHV.
• UV lamp (hv = 21.2/40.8 eV) for UHV.
• Ion gun for sample cleaning and ion scattering in UHV.
• Low energy electron flood gun for charge compensation.
• In-situ sample cooling and heating from 120 to 1073 K (UHV) and 200 to 873 K (25 mbar).
• Typical sample size < 10 mm x10 mm and 1 mm thick.
• Polar and azimuthal rotation.

AP-STM Capabilities:
• Imaging from ambient pressure (100 mbar) to UHV.
In-situ sample cooling and heating from 220 to 773 K (UHV) and 298 to 523 K (10 mbar).

Preparation Chamber Capabilities:
• Low energy electron diffraction with Auger electron (AES) and electron energy loss spectroscopy (EELS) capabilities.
In-situ sample cooling and heating from 120 to 1073 K (UHV).
• 4-pocket e-beam evaporator.

I manage the interface and surface science tools in the CBEE department at Oregon State University. Please contact me directly for information about using any of these research capabilities.

For more details click here APSCL